R, Gopi; M, Tamil Selvi; G, Saranraj; P, Nagaraj; K, Parthiban; A, Ranjith Kumar. Automated Machine Learning Classification Framework to Predict Crop Yield and Detect Pest Patterns. International Journal of Experimental Research and Review, [S. l.], v. 46, p. 177–190, 2024. DOI: 10.52756/ijerr.2024.v46.014. Disponível em: https://qtanalytics.in/journals/index.php/IJERR/article/view/3933. Acesso em: 20 jan. 2025.